JTAG Boundary Scan Test Systems (IEEE 1149.1)

Featured Case Study

ARM selects XJTAG for RealView development tools debug and test

ARM

ARM selects XJTAG for RealView development tools debug and test

ARM, the world's leading semiconductor intellectual property (IP) supplier, has reduced the time and cost of developing its range of RealView development tools by using the XJTAG boundary scan development system to improve and speed up the process of debugging and testing its high density, multi-layer development boards.

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