News Articles – 2004
Electronics Weekly - Oct 12 2004 
Shortlists for EW Awards
EE Times - January 13 2005
Board test comes for free.
Electronics Weekly - December 24 2004
Graphical JTAG test tool.
EE Times - December 23 2004
Boundary scan add-on eases production testing.
EE Product Center - December 22 2004
JTAG targets production test.
Embedded Star - July 15 2004
XJTAG boundary scan to integrate into DiagnoSYS' PinPoint II tester.
Embedded Star - June 9 2004
XJTAG enhances boundary scan development system.
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What people are saying...
We are using XJTAG right across the product lifecycle. Our designers are using it to get prototype boards up and running more quickly, and our production engineers have built XJTAG into an automated in-line JIG tester, which has greatly improved our production line test times. ’
Mike Jones, Hardware Manager, TVonics - Apply today for your Free XJTAG trial
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