News Articles – 2004
Electronics Weekly - Oct 12 2004 
Shortlists for EW Awards
EE Times - January 13 2005
Board test comes for free.
Electronics Weekly - December 24 2004
Graphical JTAG test tool.
EE Times - December 23 2004
Boundary scan add-on eases production testing.
EE Product Center - December 22 2004
JTAG targets production test.
Embedded Star - July 15 2004
XJTAG boundary scan to integrate into DiagnoSYS' PinPoint II tester.
Embedded Star - June 9 2004
XJTAG enhances boundary scan development system.
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What people are saying...
"Compared to other systems, XJTAG delivers an outstanding price/performance ratio and is well supported, both through direct contact with the manufacturer as well as local support from their distributor partner.
XJTAG is an effective tool that has helped us increase quality as well as productivity."
Mathias Leumann
Founder and CEO
Leutron Vision - Apply today for your Free XJTAG trial
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