JTAG Boundary Scan Test Systems (IEEE 1149.1)

News Articles – 2005

EE Times - December 12 2005

CEM installs XJTAG system

EE Times - November 21 2005

Chain debugger said to cut circuit debug, test times

Electronics Weekly - Oct 17 2005

Thales moves to JTAG for board testing

Plug and play - EMP - October 2005

Since its introduction as an industry standard in 1990, boundary scan (also known as JTAG) has enjoyed growing popularity for board level manufacturing test applications. JTAG (Joint Test Action Group) as defined by the IEEE 1149.1 Standard, is an integrated method for testing interconnects on PCBs that is implemented at IC level. One company that has taken the principles of JTAG a stage further is Cambridge-based XJTAG. EMP's Dave Tudor visited the company to see how an already-established technology could be enhanced even more. Full article    (PDF, 1.8 MB)

eGov - May 18 2005

Lord Sainsbury welcomes technologies from around the world at UK Trade and Investment event.

EE Times - February 8 2005

Hansatech to use XJTAG in test chain

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