JTAG Boundary Scan Test Systems (IEEE 1149.1)

News Articles - 2008

Cornerstone of production test
Electronics Assembly – September/October 2008

Contract manufacturers striving to meet test coverage and cycle-time challenges are increasingly using the latest boundary scan equipment to co-ordinate multiple techniques including functional test and built-in self test.

Some tools, such as the XJTAG boundary scan development system, incorporate a high-level testprogramming language, which allows test engineers to compile detailed tests without having to understand how boundary scan works. Full article  

Using the JTAG Chain for Accurate System and Intra-Die Power and Thermal Analysis
Xilinx Xcell Journal – Third Quarter 2008

Engineers typically use the boundary scan chain to program devices such as CPLDs or flash memories. But more engineers should be tapping into the power of boundary scan as a way of extracting detailed information about how boards or systems are functioning.
Full article:  English    (PDF, 1.1MB)  |  日本語    (PDF, 1.4MB)

Boxing clever – New Electronics – April 2008

TVonics has a reputation for ease of use and energy efficiency. One recent addition has been XJTAG’s development system, which is being used by the design facility to speed up debug and test of ball grid array (BGA) populated printed circuits boards. With most BGA devices having some form of JTAG support, designers and production engineers are finding there are few better ways of getting to the pins. Full article  

Q10 interview with Simon Payne, CEO at XJTAG
Business Weekly – April 2008

The cost of test in development is now becoming a critical factor and needs to be considered earlier in the design cycle - even before any hardware is produced. XJTAG provides a test solution across the whole product life cycle, and by providing reusable code and the ability to test JTAG-enabled and non-JTAG devices, the test development time and cost is reduced. There are very few solutions on the market that take this approach.
Full article  

XJTAG makes important breakthrough in digital television deal – Business Weekly – April 2008

TVonics Solutions, the British digital television device manufacturer, has selected the XJTAG boundary scan development system to debug, test and programme its range of energy efficient digital TV products. Full article  

Business Weekly - East of England

evertiq speaks to XJTAG CEO Simon Payne
evertiq – March 2008

evertiq has spoken to Mr. Simon Payne, CEO of UK based supplier of IEEE 1149.1 JTAG compliant boundary scan development systems, XJTAG, and asked about the development within the boundary scan test solution market in Europe.
Full article - www.evertiq.com

Q5 interview with Simon Payne, CEO of XJTAG
Electronics Weekly – February 2008

The increased density of boards and the trend towards BGA packages is driving a worldwide demand for boundary scan. The cost of test in development is now becoming a critical factor and needs to be considered earlier in the design cycle, even before any hardware is produced. We provide a test solution across the whole product life cycle, and by providing reusable code and the ability to test non-JTAG devices, the test development time and cost is reduced. There are very few solutions in the market that take this approach. Full article    www.electronicsweekly.com

Poetry in motion – EMP – January 2008

The XJTAG boundary scan system has been implemented at ETEL’s 12,000m2 engineering and manufacturing centre in Môtiers, Switzerland. ETEL provides advanced motion control technology to a range of industries from semiconductor and electronics manufacturing to biomedical, machine tools and precision automation. Headquartered in Switzerland, and with subsidiaries throughout Europe and North America, ETEL supports the high tech industry with linear motors, torque motors, positioning stages, and motion controllers. Full article  

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