JTAG Boundary Scan Test Systems (IEEE 1149.1)

XJTAG supports Micron Phase Change Memory with JTAG test tools – 20 July 2010

XJTAG is the first to provide support for Micron Phase Change Memory (PCM). PCM enables enhanced system performance, and is programmed in situ after the board is assembled. XJTAG, working with Micron, has developed a solution to program PCM at close to its maximum programming speed using the XJTAG boundary scan system.  English  |  日本語

Imagination Technologies adopts XJTAG to speed development of system-on-chip designs
2 March 2010

Imagination Technologies, the leading multimedia and communications chip technologies company, is using the XJTAG boundary scan development system to accelerate the development of its systems-on-chip designs for customers across the mobile phone, handheld, mobile computing and in-car electronics markets.  English  |  Français  |  한국어

XJTAG unveils XTR series – its second generation boundary scan system – 7 January 2010

XJTAG has announced its second generation boundary scan solution, the XJTAG XTR series.

The XJTAG XTR series includes all the features of the XJTAG development system plus lots of new features and usability enhancements, from support for multiple JTAG chains to the ability to measure supply rail voltages and signal frequencies.  English  |  Français  |  日本語

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