Electronics Test Method Finder

Use the sliders to set your requirements to compare key PCB testing methods including AOI, AXI, Bed of Nails, Functional Test, Flying Probe and JTAG Boundary Scan

Signals

Analogue Mixed-signal Digital

Complex ICs (FPGA, CPLD, MCU, SoC)

0 10 20+

Number Of Programmable Devices (NAND, NOR, eMMC Flash)

0 10 20+

Passives Count

10 100 1000+

Layer Count

1 2 4 8 16+

Development Stage

proof-of-concept prototype development manufacture service

Implementation Deadline

1 week 1 month 1 year+

Test Budget

$10k $100k $1M+

Finished Product Value

$100 $1,000 $10,000+

Production Volume

Bespoke 100/year 10,000/year 1,000,000/year

Quality Environment

Consumer goods Utilities/Instrumentation Automotive Aerospace Medical/Nuclear

Your Recommended Test method Is X

Your needs (in yellow) are based on your answers. Click a test method to compare with your needs. Go back to previous sections to adjust your choices.

Functional Test

A comprehensive testing approach that verifies the complete functionality of a device by testing it under real-world operating conditions. This method ensures that all components work together as intended.

Pros
  • Tests complete system functionality as designed
  • Catches integration issues
  • Validates real-world performance
Cons
  • Coverage of edge-cases can be low
  • Requires bespoke development for each project
  • Limited debug and troubleshooting

For Functional Test we recommend IPSES and 6TL. For combined functional test and JTAG boundary scan solutions visit XJTAG.