JTAG Boundary Scan Test Systems (IEEE 1149.1)

XJRunner — Run-time environment for XJEase tests

XJRunner is the specialised run-time environment for executing pre-compiled XJDeveloper projects. With a range of special features it is particularly aimed at board manufacturers and in-field support.

In one package, you have interconnect testing, in-system programming, non-JTAG device testing, serial number handling and configurable log files for your audit trail.

It has an easy-to-use GUI, with all the testing capabilities of XJEase.

Get the XJRunner datasheet  PDF  |  View all datasheets
Watch the XJRunner demo  Production optimised run-time environment

XJRunner in Advanced User and in Basic User mode
 click on the image to enlarge

Key Benefits

  • Improves your QA through configurable logging.
  • Allows you to retain the power of control on how boards are tested by third parties.
  • User-friendly environment reduces your training costs for production operatives.
  • Ability to test multiple boards, simultaneously, by using multiple XJLinks

Features

  • Run-time environment for XJEase tests.
  • Simple, controlled test execution.
  • Handles a variety of serial number systems.
  • Log files for audit trail.
  • Optional restricted access for test-only users.
  • Two modes for simultaneous board testing
  • Board statistics and fault trend analysis
  • Physical location of faulty nets can be displayed visually in the Layout Viewer

Simple, secure & audited production testing

Package your XJEase test system, created by design or test engineers, into a single compressed and encrypted file to ensure consistency in your testing process.

Excellent for the shop floor. A simple Run/Stop, Pass/Fail interface makes first pass testing a simple point-and-click operation. Configurable run-time messages can tell the tester about any required procedures both before and after testing each board.

Using multiple XJLinks, save time by testing a batch of boards simultaneously as a group. Alternatively, run through them independently and continuously by unplugging one board that has finished and plugging in a new one whilst tests are still running on your other XJLinks.

User Management

XJRunner has different levels of users, from Basic users who can simply run a complete set of tests on a board, to Advanced users who can carry out more complex testing and manage projects. Each user can have a separate login. This not only identifies users for audit use, but also allows you to restrict their access to those features they have been trained to use.

Powerful, flexible, diagnostic testing

Identify faulty boards on the production line with a default set of Pass/Fail tests.

XJRunner provides statistics on the percentage of boards that have passed/failed as well as Fault Trend Analysis, highlighting tests prone to failure.

Advanced users can then pinpoint faults by running additional tests and debug procedures. They can also choose to run a particular test, or set of tests, a number of times, or even run a test continuously to help diagnose particularly tricky or intermittent problems on a board.

If any faults are found when running tests, the Layout Viewer can be used to locate the faults on the physical board by showing the routing of nets, which highlight the potential problem areas.

Log Files

All the output from tests is logged. There is a range of logging options, to choose both what is logged (time, date, serial number, user information, etc.) and how the logs should be grouped (e.g. keep all output for the same board in the same file).

Serial Numbers

XJRunner can program and log serial numbers for a set of boards. Alternatively, more complex ones (e.g. MAC addresses) can be created by XJEase code or input directly (e.g. from a barcode reader).

Easily Portable Testing

All of the files needed to run tests on a board are packaged together in one XJPack file, making it easy to transfer tests between different computers and sites.

For support, or for a quote on any part of the XJTAG system, please contact us.


XJTAG Ltd. © Copyright 2012. All rights reserved. Part of IEEE 1149.1