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The XJTAG Test Suite gives you a comprehensive set of test applications and high-performance JTAG boundary-scan controllers. Built on a powerful common platform, these form a fully integrated environment for rapid test generation, real-time debugging, production test execution, and in-system programming. Choose from a range of software packages and controllers to suit your test and programming use case.

XJDeveloper

Full IDE for rapid test and in-system programming development and debug. Test coverage analysis, XJRunner app and extensive library of non-JTAG device models included.

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XJInvestigator

Manufacturing Repair/Rework Station. Integrated test and debug environment for graphical fault analysis. In-system programming using SVF/STAPL files.

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XJRunner

Production test tool for high or low volumes with power diagnostics built in. Test and/or program with fast fault location and visualisation.

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XJAnalyser Module

Graphical analysis/debug add-on to XJDeveloper or XJRunner. Real-time control of JTAG device pins. In-system programming using SVF/STAPL files.

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XJFlash Module

Ultra-fast FPGA-accelerated flash programming add-on to XJDeveloper. Up to 50× faster performance than conventional boundary-scan.

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XJAnalyser with XJLink2

Standalone visual analysis/debug tool with XJLink2 test controller. Control JTAG device pins directly or program using SVF/STAPL files.

£6,190.00 View product