JTAG Boundary Scan Test Systems (IEEE 1149.1)

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JTAG Tools for Board Designers

Design for Test techniques


Using our design-for-test (DFT) guidelines, you can include JTAG in your designs, from the very beginning of the design process. 

Improve circuit board testability and reduce re-spins

You can reduce the number of test points in your circuit board designs as JTAG give you direct access to the pins on your BGA devices; this can reduce the physical size of the board and make layout easier. Once you have a circuit design, you can easily verify that the JTAG chain is correctly routed and that you have all the necessary access from the JTAG devices to test the non-JTAG devices on your board.

As you refine your design our circuit analysis utilities allow you to achieve superior test coverage when your design moves into the later stages of prototyping, manufacturing and servicing. As your design develops, XJTAG automatically handles any netlist changes for you, adapting to the new circuit connections.

Rapid JTAG test development

Setting up XJTAG is quick and easy thanks to the reusability of XJTAG tests for non-JTAG devices. These tests are the same regardless of the rest of your circuit; this means that you can reuse the tests whenever you reuse a device - in the same circuit, or on a different project.

Many tests can be downloaded from the XJTAG support pages.


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