ARM selects XJTAG for RealView development tools debug and test

ARM Case Study

ARM®, the world’s leading semiconductor intellectual property (IP) supplier, has reduced the time and cost of developing its range of RealView development tools by using the XJTAG boundary scan development system to improve and speed up the process of debugging and testing its high density, multi-layer development boards.

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The XJTAG boundary scan system is an extremely powerful, versatile and cost effective product which has enabled ARM to improve and speed up the process of debugging and testing its RealView development tools.

With XJTAG, we are now close to meeting our target for 90 percent test coverage and ten-minutes-per-board production test, but we also have a boundary scan system that allows tests to be recorded, refined and repeatedly re-used throughout the development cycle both by our engineering team and our contract manufacturing partners.

Spencer Saunders, Engineering Manager, Platforms, Development Systems – ARM

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