Reducing test cycle time while increasing test coverage is an important goal for equipment builders serving all types of markets, including military, aerospace, and transportation. As the use of devices in advanced packages continues to increase, the test coverage that can be achieved using typical probe-based test techniques is reduced.
Many high-performance components on the market today are JTAG-compatible devices which have built-in boundary scan circuitry. Boundary scan provides a convenient way to test devices without requiring physical access to probe each pin.
Imagination Technologies has opted for an XJTAG boundary scan system to test and debug its multimedia system-on-chip devices. Boundary scanning is used to test and debug prototypes, test assemblies and customer development boards. It allows for the compilation of effective test scripts even before the hardware is ready.