JTAG Boundary Scan Test Systems (IEEE 1149.1)

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XJDeveloper — Advanced graphical interface

Advanced graphical interface to configure XJTAG to test your circuit

XJDeveloper is a graphical application that allows you to quickly and easily set up and run tests on your circuit. With XJDeveloper you can reduce your time to market by reusing your test scripts all the way through the product design process and then in manufacturing.

XJDeveloper’s built-in connection test, combined with XJEase tests for non-JTAG devices, checks your boards for short-circuit and open-circuit faults. Using XJDeveloper you can easily create or customise tests. The DFT analysis allows you to see your boards’ test coverage while the built-in netlist explorer provides a simple interface for you to view the connectivity between devices.

XJDeveloper can also be used to program both JTAG devices (e.g. CPLDs, FPGAs) and non-JTAG devices (e.g. EEPROMs, Flash).

Get the XJDeveloper datasheet  reusable IEEE 1149.1 test scripts  (PDF)  |  View all datasheets

Features

Key Benefits

  • Reduce your time spent debugging boards due to high precision fault isolation
  • Improve your time to market and reduce project risk by early design verification
  • Reduce your test development time by reusing tests from prototype/design in manufacturing and field support
  • Ongoing time savings by test reuse across projects

Advanced Connection Test

A proprietary connection test can be run on the board as part of a script. By making use of its knowledge of the nature and interconnection of the devices in the circuit, XJTAG is able to test a higher percentage of a circuit than most other JTAG solutions. By monitoring the status of the devices in the circuit, XJTAG also provides you with more information about the location and precise nature of any faults that are found.

XJEase — Flexible, high-level, test description language

All the advantages and flexibility of a programming language, such as loops, variables and flow control, can now be applied to developing device and circuit tests. By generating test patterns as required, under the control of a high-level XJEase program, you can use XJTAG to easily develop complex tests not possible with many other JTAG solutions.

Device-centric — reusable tests

Building an XJDeveloper test system requires no knowledge of the underlying JTAG technology. All device tests written in XJEase are independent of the specific circuit under test. Tests are written from the device's perspective; they specify the pin levels required to run the test and any pin states expected as a result. XJTAG then uses its knowledge of the circuit to create test patterns that will achieve the required inputs. This means that once tests have been developed for a device they can be reused in any circuit without any additional work.

Testing and programming non-JTAG devices

XJDeveloper can be used to test or program non-JTAG devices including Flash, all types of RAM, FIFO arrays, IIC devices, SPI devices and Ethernet controllers.

FREE Test Library

A large number of device files for testing non-JTAG devices are available for download, including examples of programming Flash and other devices. Even if you have never used JTAG before, it is possible to create a fully functioning test system with no extra programming.

If you can’t find a file for your exact device, you can download the file for a similar device and make a few changes to adapt it to yours. We also offer a consultancy service to design tests to your exact requirements.

No need to understand how JTAG works

If you do have to create your own tests XJDeveloper makes this easy by abstracting the description of how a device is to be tested from the detail of creating the JTAG test vectors to implement those tests; this means that the process of developing tests for your non-JTAG devices is quick and easy.

XJDeveloper will check that the pins on a device to be tested are on nets accessible from JTAG devices and then work out which JTAG device pins must be manipulated to access the correct nets.

XJDeveloper screenshot, showing the high-level language used to create a connectivity test for a memory device

Similarly, once you have a test file for a device, it can be reused whenever that device is part of another circuit.

Multiple boards

Testing multiple boards is as easy as testing a single board. There is no complex merging to be done; simply give XJTAG the netlists and tell it how the boards are connected together. Everything else is worked out by the underlying engine at runtime.

Running Tests

You can run tests from within XJDeveloper. However, there are other ways of running your tests, depending on your requirements.

XJRunner is our run-time solution for the production/servicing environment. It is aimed at board manufacturers and/or in-field testing, with additional logging, serial numbering and user management capabilities. It has both a GUI and a command-line version, to allow you to integrate XJTAG with other test systems. The GUI can run tests on multiple boards simultaneously for use in manufacturing applications.

XJDebug is the command-line interface to XJEase during development and prototyping. It includes a classic style debugger, allowing you to:

  • Step through code a line at a time.
  • Set and remove breakpoints.
  • Check and set the values of any variables in the code.
  • Record interactions with the hardware for later playback.

Netlists

Supported netlists include EDIF 2 0 0, RINF, Protel, PADS-PCB, Cadence Allegro, P-CAD, Genrad, BoardStation (Mentor), Zuken, Protel V2 and over 50 other formats. These formats are automatically recognised by the XJTAG applications. If you can't get the netlist in a format we recognise we'll both convert it and add support to future versions for you.

For support, or for a quote on any part of the XJTAG system, please contact us.


XJTAG Ltd. © Copyright 2010. All rights reserved. Part of IEEE 1149.1