Why AI Chip Vendors Must Rethink Test
Imagine this, AI chips power the next generation of high-speed, high-density systems, but your design and manufacturing customers can’t fully test them after assembly. Hours vanish as engineers run functional tests, probing for solder issues, only to miss faults that silently degrade performance over time.
This challenge is intensified by the use of BGA (Ball Grid Array) packages for AI chips. With solder joints and I/O pins hidden beneath the device, engineers can’t access them for visual inspection or probing. Once assembled, there’s simply no physical way to check whether every connection is sound, making structural test methods like boundary scan essential for uncovering hidden defects.
The Problem
Across the industry, many engineers supporting AI chip customers believe boundary scan isn’t being used for PCBA testing. They assume functional tests are enough to confirm solder quality and I/O connectivity, especially for high-speed interfaces and memory devices.
However, there are two major issues with this assumption:
- Undetected faults: Functional tests can pass boards that actually have hidden faults. Cold solder joints, marginal opens, and partial connections can appear “good” at speed because of capacitance effects. These faults often worsen over time, leading to intermittent or early-life failures that are very expensive to diagnose and fix later.
- Limited fault insight: When functional tests do detect that something’s wrong, they rarely reveal what the fault is or where it’s located without considerable extra development time. This makes fault isolation slow, reactive, and very costly!
The Misconception
Some engineers think boundary scan can’t detect cold solder or high-speed I/O problems, and as a result, BSDL (Boundary-Scan Description Language) support is being dropped from some new AI chip designs.
This belief is not only outdated but highly risky. That’s a dangerous oversight, especially as AI devices use dense BGA packaging. Because these devices have no exposed leads or probe points, boundary scan provides the quickest and most effective diagnostic tool for verifying connectivity beneath the package. Removing boundary scan support leaves customers without an easy, reliable way to detect and isolate faults that would otherwise remain hidden.
The Smarter Approach
Boundary scan operates at low speed, and that’s exactly why it works so well. By testing static interconnections and device pins, it reveals faults that high-speed functional tests often mask. It can detect:
- Opens, shorts, and poor solder joints beneath BGAs.
- Faults in high-speed signal paths that appear stable during functional tests.
- Issues in signal distribution and memory interfaces that degrade over time.
Boundary scan isn’t a replacement for functional testing, it’s complementary. Together, they form part of a complete test strategy that improves yield, reliability, and customer satisfaction.
The Call to Action for AI Chip Vendors
For AI chip leaders like NVIDIA, AMD, ARM, and Intel, supporting boundary scan shouldn’t be just a checkbox, it’s a commitment to reliability and customer success. Providing a full BSDL file enables customers to integrate AI devices into their board-level tests, improving product quality across the ecosystem.
Fully implementing boundary scan in AI devices ensures that engineers can:
- Validate PCBA connectivity on the board or even between boards.
- Help identify weak or marginal connections that could lead to intermittent faults.
- Detect manufacturing defects earlier and at lower cost.
The Turning Point
In real-world prototyping and production, companies adopting full boundary-scan testing have cut debugging time from days to minutes, catching subtle connection faults invisible to functional testing. That’s the difference between reactive troubleshooting and proactive reliability.
What About You?
If you’re developing, producing and supporting AI chips, now is the time to rethink the test strategies you support. Boundary scan isn’t just a nice-to-have; it’s a necessity for you and your customers.
Explore over 100 real-world examples of how companies have transformed their fault isolation and testing using boundary scan technology: View case studies
Or experience it first-hand: Try XJTAG with your own board and see how fast, structured testing exposes the faults functional testing misses.
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