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In the News

Xilinx Xcell Journal – October 2008

Using the JTAG Chain for Accurate System and Intra-Die Power and Thermal Analysis

Engineers typically use the boundary scan chain to program devices such as CPLDs or flash memories. But more engineers should be tapping into the power of boundary scan as a way of extracting detailed information about how boards or systems are functioning.
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XJTAG Article in Xilinx Xcell Journal
Electronics Assembly – September 2008

Cornerstone of production test

Contract manufacturers striving to meet test coverage and cycle-time challenges are increasingly using the latest boundary scan equipment to co-ordinate multiple techniques including functional test and built-in self test. Some tools, such as the XJTAG boundary scan development system, incorporate a high-level testprogramming language, which allows test engineers to compile detailed tests without having to understand how boundary scan works.
XJTAG Article
Business Weekly – April 2008

Q10 interview with Simon Payne, CEO at XJTAG

The cost of test in development is now becoming a critical factor and needs to be considered earlier in the design cycle - even before any hardware is produced. XJTAG provides a test solution across the whole product life cycle, and by providing reusable code and the ability to test JTAG-enabled and non-JTAG devices, the test development time and cost is reduced. There are very few solutions on the market that take this approach.
XJTAG Article
New Electronics – April 2008

Boxing clever

TVonics has a reputation for ease of use and energy efficiency. One recent addition has been XJTAG’s development system, which is being used by the design facility to speed up debug and test of ball grid array (BGA) populated printed circuits boards. With most BGA devices having some form of JTAG support, designers and production engineers are finding there are few better ways of getting to the pins.
XJTAG Article
Business Weekly – April 2008

XJTAG makes important breakthrough in digital television deal

TVonics Solutions, the British digital television device manufacturer, has selected the XJTAG boundary scan development system to debug, test and programme its range of energy efficient digital TV products.
evertiq – March 2008

evertiq speaks to XJTAG CEO Simon Payne

evertiq has spoken to Mr. Simon Payne, CEO of UK based supplier of IEEE 1149.1 JTAG compliant boundary scan development systems, XJTAG, and asked about the development within the boundary scan test solution market in Europe.
Electronics Weekly – February 2008

Q5 interview with Simon Payne, CEO of XJTAG

The increased density of boards and the trend towards BGA packages is driving a worldwide demand for boundary scan. The cost of test in development is now becoming a critical factor and needs to be considered earlier in the design cycle, even before any hardware is produced. We provide a test solution across the whole product life cycle, and by providing reusable code and the ability to test non-JTAG devices, the test development time and cost is reduced. There are very few solutions in the market that take this approach.
XJTAG Article
EMP – January 2008

Poetry in motion

The XJTAG boundary scan system has been implemented at ETEL’s 12,000m2 engineering and manufacturing centre in Môtiers, Switzerland. ETEL provides advanced motion control technology to a range of industries from semiconductor and electronics manufacturing to biomedical, machine tools and precision automation. Headquartered in Switzerland, and with subsidiaries throughout Europe and North America, ETEL supports the high tech industry with linear motors, torque motors, positioning stages, and motion controllers.
XJTAG Article

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