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In the News

EE TIMES – December 2004

Boundary scan add-on eases production testing

XJTAG has developed XJRunner, a graphical add-on to its XJTAG boundary scan development system and designed for production sites that need to improve and speed up the testing of densely populated printed circuit boards — particularly those with JTAG devices such as ball grid array (BGA) and chip scale devices, flip chips and other high-density packages, which cannot be tested by traditional methods.
EE PRODUCT CENTER – December 2004

JTAG targets production test

Boundary-scan test-system developer XJTAG has just added a graphical add-on to its boundary-scan IEEE-1149.1 JTAG (Joint Test Action Group) development system.
EMBEDDED STAR – July 2004

XJTAG boundary scan to integrate into DiagnoSYS' PinPoint II tester

DiagnoSYS (www.diagnosys.com), a world leader in electronics test, inspection and programming, has signed an agreement with XJTAG Limited (www.xjtag.com), a specialist design and test tool developer and part of the Cambridge Technology Group, to enable it to integrate the XJTAG boundary scan development system into its PinPoint II advanced in-circuit tester.
EMBEDDED STAR – June 2004

XJTAG enhances boundary scan development system

XJTAG Limited (www.xjtag.com), a specialist design and test tool developer and part of the Cambridge Technology Group, has announced a raft of extra features for its XJTAG boundary scan Development System, designed to cut the cost and shorten the development cycle of electronic products.

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