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EE TIMES – December 2004
Boundary scan add-on eases production testing
XJTAG has developed XJRunner, a graphical add-on to its XJTAG boundary scan development system and designed for production sites that need to improve and speed up the testing of densely populated printed circuit boards — particularly those with JTAG devices such as ball grid array (BGA) and chip scale devices, flip chips and other high-density packages, which cannot be tested by traditional methods.
EE PRODUCT CENTER – December 2004
JTAG targets production test
Boundary-scan test-system developer XJTAG has just added a graphical add-on to its boundary-scan IEEE-1149.1 JTAG (Joint Test Action Group) development system.
