What’s new in XJTAG 4.3: FTDI Support

The XJTAG test suite (version 4.3 and later) includes support for JTAG controllers produced by Future Technology Devices International (FTDI™).*

Whether the FTDI device is included on a target board design or built into a cable (such as FTDI’s C232HM-xxx), it provides a direct connection between a computer’s USB port and the board’s JTAG chain.

XJTAG’s FTDI support gives engineers an additional way to access to the capabilities of XJTAG’s boundary scan test and programming systems.

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XJTAG boundary scan helps us easily localise any problems, which saves time and simplifies PCBA rework.” Ufuk Onder Senior, Hardware Design Engineer – TUBITAK UZAY Read case study

XJTAG has features that are vastly superior to other systems I know. The learning curve for new users is dramatically shorter. James Diem, Test Engineering Manager – Eaton Read case study

XJTAG is an absolute necessity for any company designing complex circuits that feature high pin count BGA or chip scale devices. XJTAG is easy to use and incredibly fast, which has enabled us to shave weeks off the development schedule for our RFeye module thereby freeing our development team from time-consuming debugging tasks. Alistair Massarella, CEO – CRFS Read case study

The XJTAG boundary scan system is an extremely powerful, versatile and cost effective product which has enabled ARM to improve and speed up the process of debugging and testing its RealView development tools. Spencer Saunders, Engineering Manager, Platforms, Development Systems – ARM Read case study

The service from XJTAG is competitively priced and offers outstanding flexibility and competencies. The support provided to facilitate integration with LabVIEW makes XJTAG really stand out against other systems. Leone Alfano, Industrialization Test Specialist – Worldline Read case study

The main benefit is in having an automated test that we can deliver to our board suppliers. The XJTAG system is very flexible and allows us to make changes rapidly. José Luis Albert Pérez, Test Automation Engineer – SEDECAL Read case study

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