Active Silicon tests its ranges of high-performance frame grabbers and camera interface products using XJTAG boundary scan. In addition to saving time by performing high-speed flash programming, XJTAG quickly achieves high test coverage enabling functional tests to be shorter and simpler for greater overall speed and efficiency.
We achieved tremendously valuable time savings using XJTAG, cutting the time to program large FPGAs from several minutes to about 35 seconds
By running the functional test application from within the XJTAG environment after the boundary scan tests, we can save plugging the board into a different test setup for functional test. And because we can program the flash devices while the board is connected, the result is a very fast and efficient process.
We also use XJAnalyser in the initial R&D for new products because it is such a quick way of checking some of the functionality.