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Press Releases

14 November 2006

XJTAG Professional Development System unveiled at Electronica

XJTAG has unveiled its XJTAG Professional development system and announced a plethora of enhancements to its award-winning IEEE 1149.1 compliant system - all designed to enable engineers to significantly reduce the time and cost of board development and prototyping.
XJTAG Press Release image
26 October 2006

Prism Electronics selects XJTAG to speed debug and test of complex BGA-populated circuits

Prism Electronics has selected the XJTAG boundary scan development system to speed up the process of debugging and testing highly complex printed circuit boards featuring high pin count ball grid array (BGA) devices such as field programmable gate arrays (FPGAs).
10 July 2006

Solarflare selects XJTAG boundary scan to debug and test Ethernet network cards

Solarflare Communications, a fabless semiconductor company that provides high-performance Ethernet solutions, has selected the XJTAG boundary scan solution to debug and test its EtherFabric EF1-21022T Network Interface Cards (NICs).
10 May 2006

XJTAG improves PCB test coverage and fault diagnosis with new XJIO expansion board

XJTAG today announced an enhancement to its award-winning XJTAG Development System. The new XJIO expansion board improves test coverage and fault diagnosis on complex printed circuits, checks power rail levels and can eliminate the need for costly custom test jigs.
09 May 2006

SMS Electronics bolsters test capability with investment in XJTAG boundary scan system

SMS Electronics, one of the UK's largest electronics manufacturing services (EMS) companies, has bolstered its already extensive test capability with the addition of the XJTAG boundary scan development system. The XJTAG system will be implemented at the company's production facility in Nottingham, England.
09 May 2006

Nepcon debut for award-winning XJTAG boundary scan development system

XJTAG, a leading supplier of boundary scan development tools, is exhibiting its award-winning XJTAG system for the first time at this year's Nepcon. The latest version - with a JTAG chain debugger added - provides circuit designers and test engineers with an 'out-of-the-box' solution to debug and test circuits populated with ball grid array (BGA) and chip scale devices.
30 March 2006

TTPCom selects XJTAG system for debug and test of BGAs on wireless development platform

TTPCom, a world-leading independent supplier of software and silicon intellectual property (IP) for digital wireless terminals, has selected the XJTAG development system as its boundary scan test solution. The XJTAG system enables engineers at TTPCom's headquarters in Cambridge, England, to diagnose and debug its wireless development platforms, which contain a plethora of ball grid array (BGA) devices and over 9,500 connections.
XJTAG Press Release image
16 February 2006

Briton EMS opts for XJTAG boundary scan to remove guesswork from test equation

Briton EMS has selected the XJTAG development system as its boundary scan test solution. The XJTAG system has been implemented at Briton EMS's production facility at Bedford, England, and will enable the manufacturer to rapidly pinpoint faults on complex and expensive printed circuit assemblies featuring high pin count ball grid arrays (BGAs).
XJTAG Press Release image

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