Zuken® and XJTAG® release free design for test (DFT) plugin to enhance Zuken’s CR-8000 Design Gateway at Embedded World 2018 in Nuremberg, Germany.
XJTAG DFT Assistant helps to validate correct JTAG chain connectivity, while displaying boundary scan access and coverage onto the schematic diagram through full integration with CR-8000. The plugin incorporates JTAG testability as part of the design process before any hardware is produced, by reporting any potential design issues. Being able to validate the design early helps engineers avoid board re-spins and costly delays to a project.
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