XJTAG® has won the DESIGN&ELEKTRONIK Innovator of the Year award for the XJTAG DFT Assistant. The XJTAG plugin allows engineers to detect errors in boundary scan chain connectivity at the design stage, speeding up the process from design to production. It is freely available for use in Altium, Cadence, Mentor and Zuken EDA products.
XJTAG announces significant updates with XJTAG v3.8. This latest version of the boundary scan system offers smarter debugging, a smoother programming experience, and better test coverage analysis.
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XJTAG, in partnership with CDT (distributor for Turkey and the Middle East), will be attending GITEX Technology Week in Dubai this October. GITEX is the largest and most renowned technology show in the Middle East, North Africa and South Asia. XJTAG will demonstrate its JTAG Boundary Scan system for testing and programming complex electronics.
Zuken® and XJTAG® release free design for test (DFT) plugin to enhance Zuken’s CR-8000 Design Gateway at Embedded World 2018 in Nuremberg, Germany.
XJTAG DFT Assistant helps to validate correct JTAG chain connectivity, while displaying boundary scan access and coverage onto the schematic diagram through full integration with CR-8000. The plugin incorporates JTAG testability as part of the design process before any hardware is produced, by reporting any potential design issues. Being able to validate the design early helps engineers avoid board re-spins and costly delays to a project.
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