Nepcon debut for award-winning XJTAG boundary scan development system

  • The XJTAG system provides circuit designers and test engineers with an ‘out-of-the-box’ solution to debug and test circuits populated with BGA and chip scale devices
  • XJTAG launches new XJIO expansion card and announces partnership with SMS Electronics at Nepcon 2006
  • Visit XJTAG on Stand H69 at Nepcon, 9-11 May 2006, Birmingham NEC

CAMBRIDGE, England, May 9, 2006 – XJTAG, a leading supplier of boundary scan development tools, is exhibiting its award-winning XJTAG system for the first time at this year’s Nepcon. The latest version – with a JTAG chain debugger added – provides circuit designers and test engineers with an ‘out-of-the-box’ solution to debug and test circuits populated with ball grid array (BGA) and chip scale devices.

At Nepcon 2006, XJTAG is making two important announcements. First, it is launching its XJIO expansion card which further improves printed circuit board (PCB) test coverage and reduces fault diagnosis time. Second, it is announcing a contract with SMS Electronics, one of the UK’s largest electronics manufacturing services (EMS). This is the latest in a series of deals with leading contract manufacturers. See separate news releases.

“Board developers and manufacturers in market leading companies are increasingly opting for XJTAG system because of its price, reusability of scripts and its unbeatable speed of test development,” says Simon Payne, CEO at XJTAG. “Engineers now have a cost-effective solution for testing printed circuit boards with multiple JTAG devices which are inaccessible to flying probes, logic analyzers, oscilloscopes and X-ray systems. With XJTAG, they can now debug and test their printed circuits in minutes/hours as opposed to days/weeks with other competitive systems.”

XJTAG customers include ARM, Barric, Briton EMS, Cambridge Broadband, Celoxica, DiagnoSYS, Hansatech, IPWireless, Level 5 Networks, nCipher, Pandora International, Prism Electronics, SMS Electronics, Thales UK, TTPCom and many others.

The XJTAG system enables circuit designers to cut the cost and shorten the development cycle and prototyping process and can migrate through the product life cycle from early design through to field support and repair.

XJTAG can test a high proportion of the circuit (both JTAG and non-JTAG devices) including BGA and chip scale devices, SDRAMs, Ethernet controllers, video interfaces, Flash memories, FPGAs (Field Programmable Gate Arrays), microprocessors and many other devices. XJTAG also enables In-System Programming of FPGAs, CPLDs (Complex Programmable Logic Devices) and Flash memories.

For more information about the XJTAG Development System, please contact XJTAG, St John’s Innovation Centre, Cowley Road, Cambridge, CB4 0DS, UK. Telephone +44 (0) 1223 223007, fax +44 (0) 1223 223009 or email Alternatively visit

About XJTAG (

XJTAG is a specialist design and test tool developer. Its JTAG (Joint Test Action Group) development system offers a competitive solution for designers and developers of electronic circuits. Utilising XJTAG allows the circuit development and prototyping process to be shortened significantly by facilitating early test development, early design validation, fast development of functional tests and test re-use across circuits that use the same devices. XJTAG is part of the Cambridge Technology Group (

What is JTAG?

Advances in silicon design, such as increasing device density and, more recently, ball grid array (BGA) and chip scale packaging, have reduced the efficacy of traditional electronic circuit testing methods. In order to overcome these problems and others; some of the world’s leading silicon manufacturers combined to form the Joint Test Action Group (JTAG). The findings of this group were used as the basis for the Institute of Electrical and Electronic Engineers (IEEE) standard 1149.1: Standard Test Access Port and Boundary Scan Architecture and subsequently the standard became known as JTAG.

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