Curtiss-Wright selects XJTAG system to improve debug and test of radar, video and graphics products

  • XJTAG used to diagnose and debug faults on Sabre and Osiris cards, which contain multiple ball grid array (BGA) devices including FPGAs
  • XJTAG selected due to its price, re-usable device-centric test scripts, and portability throughout product lifecycle

CAMBRIDGE, England, 10 March, 2008 – Curtiss-Wright Controls Embedded Computing, a leading designer and manufacturer of commercial-off-the-shelf (COTS) systems and board level products, has selected the XJTAG boundary scan development system to improve the process of debugging and testing its range of radar, video and graphics products.

The XJTAG system has been utilised by engineers at Curtiss-Wright’s video and graphics group in Letchworth, UK, to debug and test its latest range of highly complex printed circuit boards which feature an increasing number of ball grid array (BGA) devices, including high performance field programmable gate arrays (FPGAs).

Alan McCormick, managing director, Curtiss-Wright’s video and graphics group, said: “We selected the XJTAG system due to its price, the speed and accuracy of fault diagnosis, and because the re-usable device-centric test scripts can be ported from project to project and migrate through design, prototyping to production and beyond.”

“Using XJTAG, we can very quickly debug and test both the boundary scan and cluster devices on our boards many of which are inaccessible to traditional test methods such as flying probes, logic analysers, oscilloscopes and X-ray systems.”

Curtiss-Wright’s video and graphics group designs rugged and benign solutions for customers across the defence, aerospace, commercial and industrial marketplaces. Its expertise encompasses radar pre-processing, scan conversion, tracking and display integrated with TV video, infra-red and sonar, as well as compression, decompression and distribution of radar and TV video across wide and local area networks.

Simon Payne, CEO, XJTAG, said: “We are delighted that Curtiss-Wright, a renowned name in the aerospace and defence market, has selected the XJTAG system to validate its latest range of PCBs, which will form part of larger solutions and be used throughout the world in vehicle, airborne and shipborne command and control consoles, vessel tracking, air traffic control and air defence systems.”

The XJTAG development system is a cost-effective solution for debugging, testing and programming electronic printed circuits boards and systems throughout the product lifecycle. The XJTAG system reduces the time and cost of board development and prototyping by allowing early test development, early design validation of CAD netlists, fast generation of highly functional tests and test re-use across circuits using the same devices.

XJTAG enables engineers to test a high proportion of the circuit (both boundary scan and cluster devices) including BGA and chip scale packages, such as SDRAMs, Ethernet controllers, video interfaces, Flash memories, FPGAs and microprocessors. XJTAG also enables In-System Programming of FPGAs, CPLDs and Flash memories.

For more information about the XJTAG system, please telephone +44 (0) 1223 223007, fax +44 (0) 1223 223009 or email Alternatively visit

About Curtiss-Wright Controls Embedded Computing (

Curtiss-Wright Controls Embedded Computing is the industry’s most comprehensive and experienced single source for embedded solutions, ranging from Processing, Subsystems, Data Communication, DSP, and Video & Graphics to the most advanced board level components and fully integrated custom systems. The Embedded Computing group serves the defense, aerospace, commercial and industrial markets and is part of Curtiss-Wright Controls Inc.

About XJTAG (

XJTAG is a leading supplier of IEEE Std. 1149.x compliant boundary scan development tools. Its JTAG (Joint Test Action Group) development system offers a highly competitive solution for designers and developers of electronic printed circuit boards and systems. Utilising XJTAG allows the circuit development and manufacturing process to be shortened significantly by facilitating early test development, early design validation, fast development of functional tests and test re-use across circuits that use the same devices. XJTAG is based in Cambridge, UK, and is part of the Cambridge Technology Group (

What is JTAG?

Advances in silicon design, such as increasing device density and, more recently, ball grid array (BGA) and chip scale packaging, have made traditional electronic circuit testing methods hard to use. In order to overcome these problems and others; some of the world’s leading silicon manufacturers combined to form the Joint Test Action Group (JTAG). The findings of this group were used as the basis for the Institute of Electrical and Electronic Engineers (IEEE) standard 1149.1: Standard Test Access Port and Boundary Scan Architecture.

Photography to accompany this news release

Alan McCormick (on left), MD of Curtiss-Wright's video and graphics group with Simon Payne, CEO of XJTAG L to r - Alan McCormick, MD of Curtiss-Wright's video and graphics group with Simon Payne, CEO of XJTAG

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