From Silicon Fen to Silicon Valley: XJTAG to exhibit at ARM TechCon 2011s

  • Following decision to open Massachusetts office, XJTAG sees huge business opportunities at the Santa Clara ARM TechCon 2011(25th – 27th October)

Cambridge, England, October 24, 2011 — XJTAG is gearing up for Silicon Valley’s annual industry show: ARM TechCon 2011 26th – 27th October where it will be showcasing its cost effective IEEE 1149.x JTAG compliant boundary scan development and test system.

The Cambridge-based company, which works with distribution partners across the world, is using the event to target businesses that are seeking cost-effective boundary scan technology to test, program and debug printed circuit boards (PCBs).

“With Ball Grid Array chips on boards becoming more prolific, many more companies are seeking a boundary scan test solution. XJTAG is an excellent value for money product because it allows the circuit development and manufacturing process to be shortened significantly, saving both time and money,” said Simon Payne, CEO XJTAG.

“We are delighted to be exhibiting at such a prestigious event, particularly following our decision to open an XJTAG office in Massachusetts.”

Simon added that the company would be announcing a number of software and product developments in the coming weeks, which it will discuss with customers at the ARM TechCon 2011 exhibition.

ARM TechCon 2011 takes place 25th – 27th October at the Santa Clara Convention Center, California, USA. XJTAG will be exhibiting at Booth 420 on the 26th – 27th October.

For more information, please contact the XJTAG marketing manager.
Tel: +44 (0)1223 223007 or email Alternatively, visit

About XJTAG (

XJTAG is a leading supplier of IEEE Std. 1149.1 compliant boundary scan development tools. Its JTAG (Joint Test Action Group) development system offers a highly competitive solution for designers and developers of electronic circuits. Utilising XJTAG allows the circuit development and prototyping process to be shortened significantly by facilitating early test development, early design validation, fast development of functional tests and test re-use across circuits that use the same devices. XJTAG is based in Cambridge, UK, and is part of the Cambridge Technology Group.

Image to accompany this news release (click image for higher resolution)

XJTAG Boundary Scan exhibits at ARM TechCon 2011

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