CAMBRIDGE, England, June 24, 2005 XJTAG Limited, a supplier of boundary scan test solutions, has been shortlisted in the ‘Product of the Year’ category (sponsored by Texas Instruments) at this year’s Elektra 2005 European Electronics Industry Awards.
The Awards recognise, reward and celebrate excellence in the electronics industry across the UK and Europe. This year’s gala dinner and awards ceremony will be held at Londons Grosvenor House Hotel on September 27.
Focusing on technical innovation and business achievement, the judges shortlisted the XJTAG boundary scan development system and a production-optimised version called XJRunner. These products were launched to meet the growing need for cost effective tools which could test smaller and more tightly packed circuit boards increasingly populated with ball grid arrays (BGAs) and chip scale devices which have no pins and cannot be tested by traditional methods.
“We are thrilled that the XJTAG system has been nominated for recognition at these prestigious, pan-European awards,” said Simon Payne, chief executive officer of XJTAG. “This is fantastic news for the team at XJTAG as it demonstrates, yet again, the huge talent that we have within our company.
“Sales of the XJTAG system have been outstanding, with board developers and manufacturers within market-leading companies such as ARM, Benchmark Electronics, Cambridge Broadband, Celoxica, DiagnoSYS, Hansatech, IPWireless, nCipher, Thales Communications UK, TTPCom, and Ubinetics choosing the system due to its competitive price and because it can drastically reduce the time it takes to test and debug boards.”
XJTAG was spun out as a wholly-owned subsidiary of the Cambridge Technology Group in February 2003 to further develop and bring to market its boundary scan development system. Funded by the directors and through a £45,000 SMART Award from the UK government, the powerful and highly intuitive XJTAG Development System is designed to cut the cost and shorten the development cycle of electronic products and can migrate seamlessly through the product life cycle from early design to field support and repair.
For more information about the XJTAG Development System, please contact XJTAG, St John’s Innovation Centre, Cowley Road, Cambridge, CB4 0DS, UK. Telephone +44 (0) 1223 223007, fax +44 (0) 1223 223009 or email firstname.lastname@example.org. Alternatively, visit www.xjtag.com.
About XJTAG (www.xjtag.com)
XJTAG Limited is a specialist design and test tool developer. Its JTAG (Joint Test Action Group) development system offers a competitive solution for designers and developers of electronic circuits. Utilising XJTAG allows circuit development and prototyping process to be shortened significantly by facilitating early test development, early design validation, fast development of functional tests and test re-use across circuits that utilise the same devices. The company is based in the U.K. at St John’s Innovation Centre, Cowley Road, Cambridge. XJTAG is a wholly-owned subsidiary of the Cambridge Technology Group (www.cambridgetechgroup.com).
What is JTAG?
Advances in silicon design, such as increasing device density and, more recently, ball grid array (BGA) and chip scale packaging, have reduced the efficacy of traditional electronic circuit testing methods. In order to overcome these problems and others, some of the world’s leading silicon manufacturers combined to form the Joint Test Action Group (JTAG). The findings of this group were used as the basis for the Institute of Electrical and Electronic Engineers (IEEE) standard 1149.1: Standard Test Access Port and Boundary Scan Architecture and subsequently the standard became known as JTAG.