Using Boundary Scan in your Test Applications
XJTAG boundary scan offers a unified testing and programming solution that can be used right across your product’s lifecycle to improve designs, reduce re-spins and enhance test coverage, fault diagnosis and production yields on complex circuits populated by BGA or other fine-pitch devices.
World leading companies select XJTAG’s proven, user-friendly solutions to significantly improve new product introduction timescales while consistently reducing lifecycle costs.
Ensure maximum test coverage and verify the design even before hardware is available.
Create flexible tests and develop ISP applications quickly and easily. Use boundary scan to debug and test your prototypes instead of costly test fixtures. Benefit from high precision fault diagnostics.
Reduce repair time and re-spins with accurate, easy-to-use diagnostic tools.
Reduce turnaround time by reusing test IP from earlier stages.
Increase yields by speeding up fault detection and repair. Run a full set of connection and functional tests developed during earlier phases of the product. Reprogram PLDs and Flash memory in-circuit.
XJTAG boundary scan enables companies to implement an extremely fast and efficient production test regime without the need for a large investment in traditional test technologies. We are proud to provide outstanding technical support and continuous improvement of our products to customers worldwide.